GRASP
GRASP
Trust your results with GRASP. Reach enhanced productivity with fast and accurate design and analysis of competitive reflector antenna solutions.
Features
- Wizard allows easy definition of single and dual reflector geometries
- Near-field and far-field calculations of vector fields
- Component library for common geometries, e.g. conic surfaces, general quadrics, radomes, panels, rectangular and circular struts
- Import of general reflector shapes from file
- Numerous and general reflector rim definitions
- Component library of mathematical feed models
- Import of general feed definitions from file and expansion in spherical modes
Values
- Accurate analysis of reflectors
- Reliable results
- Increased productivity through efficient project file handling
- Easy to import feed data from other software vendors or test ranges
- Possibility for add-on modules
- Quick setup of complicated geometry
Analysis and design of reflector antenna systems
Dedicated software for reflector systems, enabling fast and accurate analysis and design of the most advanced reflector antenna systems. Multiple antennas may be defined within the same project, and the general command structure enables the user to define which of those will be considered during a given analysis. This opens for the possibility of making advanced scattering analysis of clusters of antennas. GRASP offers an advanced PO algorithm as the baseline analysis method, supplemented by optional GTD and Moment Method solvers for advanced applications.
Easy definition of single and dual reflector geometries by built-in wizard
The intuitive wizard in GRASP allows for easy setup of single reflectors, Gregorian and Cassegrain systems as well as axially displaced dual reflectors. The wizard generates a good starting point for continued and more elaborate investigation of antenna designs. Further modifications may include changing the surface profile, the rim or edges, the surface material as well as adding other objects to simulate the antenna environment, investigating near fields and more.
Near-field and far-field analysis
The algorithms available for radiation pattern analysis applies equally well to field points in the far-field of the antenna as to points very close. In addition to presentation of standard far-field pattern cuts and contours, it is therefore also possible to inspect the near-field, for example to judge the planarity of an antenna's aperture field, or to visualize the field from one antenna on surrounding objects, antenna towers, etc.
General source models
In addition to the built-in mathematical models to simulate feed radiation patterns, it is possible to utilize more realistic patterns stemming from measurements or predictions from specialized feed design programs such as CHAMP. Moreover, since any feed data imported from file will automatically be expanded in spherical wave modes, the subsequent computation of e.g. induced PO currents will be based on the actual feed near-field performance rather than the far field. Particularly in dual offset VSATs, the subreflector is placed very close to the feed where the source field may differ substantially from the far field.
Add-on modules for GRASP
Contact us
Miguel Fullana
- Head of Sales
- Tel.: +45 3334 6435
- E-mail: info@ticra.com
