Analysis and design of reflector antenna systems
Dedicated software for reflector systems, enabling fast and accurate analysis and design of the most advanced reflector antenna systems. Multiple antennas may be defined within the same project, and the general command structure enables the user to define which of those will be considered during a given analysis. This opens for the possibility of making advanced scattering analysis of clusters of antennas. GRASP offers an advanced PO algorithm as the baseline analysis method, supplemented by optional GTD and Moment Method solvers for advanced applications.
Easy definition of single and dual reflector geometries by built-in wizard
The intuitive wizard in GRASP allows for easy setup of single reflectors, Gregorian and Cassegrain systems as well as axially displaced dual reflectors. The wizard generates a good starting point for continued and more elaborate investigation of antenna designs. Further modifications may include changing the surface profile, the rim or edges, the surface material as well as adding other objects to simulate the antenna environment, investigating near fields and more.
Near-field and far-field analysis
The algorithms available for radiation pattern analysis applies equally well to field points in the far-field of the antenna as to points very close. In addition to presentation of standard far-field pattern cuts and contours, it is therefore also possible to inspect the near-field, for example to judge the planarity of an antenna's aperture field, or to visualize the field from one antenna on surrounding objects, antenna towers, etc.
General source models
In addition to the built-in mathematical models to simulate feed radiation patterns, it is possible to utilize more realistic patterns stemming from measurements or predictions from specialized feed design programs such as CHAMP. Moreover, since any feed data imported from file will automatically be expanded in spherical wave modes, the subsequent computation of e.g. induced PO currents will be based on the actual feed near-field performance rather than the far field. Particularly in dual offset VSATs, the subreflector is placed very close to the feed where the source field may differ substantially from the far field.
Scattering between multiple objects
GRASP can perform analysis using geometrical theory of diffraction (GTD/UTD) on large and complex reflectors and constructions. At frequencies where the structure may be of thousands of wavelengths in diameter, the user can investigate the scattering between many objects. This applies equally well to large, ground-based telescopes and space-borne equipment.
Identify possible ray paths
A plot of the ray tracing will often reveal details about scattering mechanisms that are not obtainable through a PO analysis. GRASP uses a highly advanced ray-tracing approach to efficiently identify the possible ray paths in a given system.
Easy setup in frame designer
The frame designer enables the user to set up planar quasi-optical networks of components and subsequently optimize the components for minimum cross-polarization, maximum confocal distance, specific phase-front radius or phase slippage. Several frames can be created and connected to model beam waveguides which are not confined to a single plane.
Easy integration with other TICRA software products
GRASP is integrated in the TICRA Tools software framework. This means that you have can access all of TICRA’s other antenna analysis-tools, such as CHAMP 3D and POS, in the same interface as GRASP. You can seamlessly interact with objects from the other products and simultaneously optimise designs across all products.
Jakob Rosenkrantz de Lasson
- Determination of Manufacturing Tolerances using Uncertainty Quantification for the Realization of a Dual Circularly Polarized Elliptical Feed Horn
- Determination of Manufacturing Tolerances of a Feed Horn using Uncertainty Quantification
- Large Reflectarray for SAR for Earth Observation: RF Design and Measurement Correlation