SNIFT
The accurate and highly stable SNIFT software transforms measured spherical near-field antenna data to far fields, accounting for the full characteristics of the measuring probe.
Features
- Allows full sphere or partial sphere input data
- Full correction for axially symmetric (m=±1) probes
- Fast Fourier Transformation and self-stabilising recurrence relations allow handling of even very large antenna structures
- Industry standard for spherical near-field to far-field transformation with probe correction
- Independent of the actual measurement system implementation
Values
- Short transformation time
- Mathematically exact pattern transformation
- The output coordinate system may be rotated to coincide with the peak direction of the far field, which is not always coinciding with any of the measurement coordinate system axes
- Non-Maxwellian measurement inaccuracies are averaged to physically correct output
- Noise reduction by means of high-order spherical mode filtering
Rotation of the spherical wave coefficients
If only a certain region of the antenna pattern has interest, it is possible to perform truncated measurements and still use SNIFT for the transformation. The transformed data are referred to the measurement coordinate system, but if, for example, the region of interest does not coincide with this system (e.g. a scanned beam), the supplementary program ROSCOE can be applied to do the appropriate coordinate transformation into a system centered around the peak.
Accurate determination of spherical harmonics
Well-founded choice of numerical implementation ensures a very stable algorithm, also for high-order harmonics. Antennas with diameters exceeding several hundred wavelengths are handled within seconds on a standard PC with accurate determination of all involved spherical harmonics.
Contact us
Jakob Rosenkrantz de Lasson
- Head of Sales and Marketing Team
- +45 3334 6436
- info@ticra.com
Research papers
- Determination of Manufacturing Tolerances using Uncertainty Quantification for the Realization of a Dual Circularly Polarized Elliptical Feed Horn
- Determination of Manufacturing Tolerances of a Feed Horn using Uncertainty Quantification
- Large Reflectarray for SAR for Earth Observation: RF Design and Measurement Correlation