Uncertainty quantification for reflectarrays

Reflectarray antennas for space applications involve a large number of elements with varying sizes to be printed on a dielectric substrate. Due to the manufacturing process, the fabricated reflectarray might have significant deviations from the desired design. This paper demonstrates an efficient method that allows the antenna designer to accurately predict the impact of manufacturing deviations on the performance of the reflectarray.

Publication: Proc. 2018 IEEE AP-S Symposium on Antennas and Propagation

Place: Boston, USA

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