Characterization of materials in the 50-750 GHz range Using a scatterometer

In this work we describe the design and operation of a scatterometer to be used at the European Space Agency. The instrument has the purpose to characterize smooth as well as rough materials, in transmission and reflection in the 50-750 GHz frequency range. We first discuss some of the design challenges encountered during the design, and later show some of the initial measured results.

Publication: 2018 International Conference on Infrared Millimeter and Terahertz Waves

Place: Nagoya, Japan

Authors:
Tonny Rubæk / Per H. Nielsen / Cecilia Cappellin / Roger Appleby / Richard Wylde / Phil Atkin / E. Saenz /
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