Characterization of materials in the 50-750 GHz range Using a scatterometer
In this work we describe the design and operation of a scatterometer to be used at the European Space Agency. The instrument has the purpose to characterize smooth as well as rough materials, in transmission and reflection in the 50-750 GHz frequency range. We first discuss some of the design challenges encountered during the design, and later show some of the initial measured results.
Publication: 2018 International Conference on Infrared Millimeter and Terahertz Waves
Place: Nagoya, JapanDownload PDF