Analysis of Printed Reflectarrays Using Extended Local Periodicity
An analysis technique for improved modeling of a printed reflectarray is proposed. The technique is based on a periodic approach where periodicity is applied on an extended unit cell, which includes the actual elements surrounding the element under consideration. An offset reflectarray sample has been manufactured and measured, and comparison of simulations and measurements is presented to verify the proposed technique.
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Publication: Proceedings of the 5th European Conference on Antennas and Propagation (EUCAP)
Place: Rome, Italy, 11-15 April 2011